Product Description
X-ray fluorescence spectrometer WDXRF Multi-element Analysis Spectrometer Wavelength dispersive X-ray fluorescence Analyzer
Multi-element Analysis Spectrometer
Features:
Simultaneous Multi-channel Measurement - Offers fast, reliable, and highly accurate analysis.
Particularly suitable for industrial and mining enterprises that require multi-element measurement.
Technology:
Utilizes Wavelength Dispersive X-ray Fluorescence (WDXRF) analysis technology.
Components:
Imported thin beryllium end-window X-ray tube from Varian Corporation, USA.
Ultra-thin 0.6μm polyester detector window from Moxtek Corporation.
Compliance Standards:
GB/T 176, JB/T 11145, JC/T 1085
X-ray fluorescence spectrometer WDXRF Multi-element Analysis Spectrometer Wavelength dispersive X-ray fluorescence Analyzer
Overview
The GA-D800 Multi-element Analyzer (Wave Dispersive) is a state-of-the-art analytical instrument developed by our company, drawing on decades of experience in X-ray fluorescence (XRF) analyzer research. Building upon our existing DM series XRF analyzers for calcium and iron, sulfur, aluminum and silicon, and multi-element analysis, the GA-D800 incorporates simultaneous (or multi-channel) Wavelength Dispersive X-ray Fluorescence (WDXRF) analysis technology. It is capable of measuring any ten elements from Na to U in a single run. For most elements, the measurement range spans from ppm levels to 100%. The instrument is characterized by fast analysis speed, high precision, minimal human error, low operator workload, one-time investment, and pollution-free operation, making it widely used in industries such as building materials, metallurgy, petroleum, chemical engineering, geology, and mining.
Key components of the DM8000 Multi-element Analyzer (Wave Dispersive) are imported, such as the 400W thin beryllium end-window X-ray tube manufactured by Varian, and the 0.6μm ultra-thin polyester window for the light element channels like Na and Mg, produced by Moxtek. The temperature control accuracy of the constant temperature chamber is less than 0.1ºC, and the gas flow system employs a high-precision gas density stabilization device with a pressure stability of less than 3Pa. Additionally, it features a sample spinning device to eliminate measurement errors caused by sample inhomogeneity. These features contribute to the analyzer's exceptional precision and accuracy, ranking it among the best in the world. The well-designed shielding ensures no radiation leakage, meeting radiation exemption requirements.
The GA-D800 Multi-element Analyzer (Wave Dispersive) particularly excels in the cement industry in China. Initially developed specifically for this sector, it complies with the national standard GB/T 176-2017 "Chemical Analysis Methods for Cement," the industry standard JC/T 1085-2008 "X-ray Fluorescence Analyzer for Cement," and the industry standard JB/T 11145-2011 "X-ray Fluorescence Spectrometer." Its performance is superior to imported counterparts in the cement industry, yet it is priced at only half the cost, offering an unmatched price-to-performance ratio. Moreover, the convenience of after-sales service from domestic companies is incomparable to that of foreign enterprises.
X-ray fluorescence spectrometer WDXRF Multi-element Analysis Spectrometer Wavelength dispersive X-ray fluorescence Analyzer
Application Scope
The GA-D800 Multi-element Analyzer (Wave Dispersive) is primarily used for the concentration measurement of Na2O, MgO, Al2O3, SiO2, SO3, TiO2, K2O, CaO, and Fe2O3 in materials such as cement raw meal, clinker, cement, and raw materials. It can be used as a standalone unit or integrated into an automatic control system for raw material proportioning, forming an "Analyzer---Microcomputer---Belt Scale" automatic control system.
In addition to the cement industry, it is also suitable for the concentration analysis of Na2O, MgO, Al2O3, SiO2, SO3, TiO2, K2O, CaO, and Fe2O3 in solid, liquid, and powder samples from power plants, brick and tile factories, metallurgy, petroleum, and geological mining departments.
X-ray fluorescence spectrometer WDXRF Multi-element Analysis Spectrometer Wavelength dispersive X-ray fluorescence Analyzer
Features
Fast and Simultaneous Analysis - The simultaneous (or multi-channel) design allows for rapid analysis of required elements, typically providing concentration results within minutes.
High Accuracy - Utilizing Wavelength Dispersive XRF analysis technology, it offers an exceptionally high resolution that energy-dispersive technology cannot match, accurately measuring adjacent light elements.
User-friendly Operation - Samples are crushed, pressed, or fused, and after placing them in the instrument, simply press the [Start] button for true one-touch operation.
Long-term Stability - Equipped with a constant temperature chamber, stable gas flow density, sample spinning devices, and variable gain digital multi-channels, ensuring excellent long-term stability.
High Reliability - The fixed channels mean there are virtually no moving parts, and the high degree of integration and strong environmental adaptability contribute to high reliability.
Powerful Software - Features ratio or matrix effect correction, deviation correction, pass rate statistics, rate value calculation, error prompts, and more. It also supports free updates to the latest version and can add software functions based on user requirements.
Environmentally Friendly and Energy-saving - The radiation protection meets exemption requirements. The analysis does not contact or destroy the sample, is pollution-free, does not require chemical reagents, and there is no need for combustion.
High Cost-performance Ratio - No need for water cooling, very low operating and maintenance costs. The price is half that of similar foreign products, making it suitable for the conditions in our country.
X-ray fluorescence spectrometer WDXRF Multi-element Analysis Spectrometer Wavelength dispersive X-ray fluorescence Analyzer
Principle
As shown in Figure 2, the X-ray tube is positioned vertically, irradiating the sample directly upwards. This arrangement minimizes the distance between them, thereby achieving maximum excitation efficiency. The sample, when irradiated by the X-rays emitted by the X-ray tube, will produce X-ray fluorescence, which then enters the spectrometer for spectral analysis. Each element corresponds to a specific spectrometer channel.
The X-ray fluorescence, after passing through a slit (if a curved crystal is used for dispersion) or a Sola slit (if a flat crystal is used for dispersion), is directed towards the diffracting crystal. The characteristic X-ray fluorescence that satisfies the diffraction condition according to Bragg's Law for the corresponding element is then directed towards the detector through another slit or Sola slit. Once the detector senses and the subsequent electronic circuit counts the fluorescence, the intensity of the characteristic X-ray fluorescence for that element is obtained. This intensity is then calibrated using a calibration equation to calculate the concentration of the element.
Figure 2: Schematic Diagram of Multi-channel WDXRF Analysis Technology.
Because its X-ray fluorescence is distinguished by wavelength through the crystal, it is called wavelength dispersion. Its resolution is independent of the detector and depends only on the crystal, thus it has a very high resolution, which is an order of magnitude higher than that of energy-dispersive systems.
X-ray fluorescence spectrometer WDXRF Multi-element Analysis Spectrometer Wavelength dispersive X-ray fluorescence Analyzer
Key Components
Imported Thin Beryllium End-window X-ray Tube from Varian, USA
The GA-D800 utilizes the EG-60 thin beryllium end-window X-ray tube produced by Varian Company, USA. This X-ray tube features an end-window design where the X-ray beam is perpendicular to the target, and the focal spot to sample distance is extremely short, thereby enhancing the excitation efficiency. The window is made of thin beryllium, and the target material is rhodium, allowing for efficient detection of light elements. The cathode is grounded, eliminating the need for a highly insulated filament transformer and also preventing electron bombardment of the beryllium window and the resulting heating. With a power rating of 400W, it only requires air cooling instead of water cooling. Due to its simultaneous multi-channel measurement capability, its performance is equivalent to that of a 4000W large scanning-type (or single-channel) X-ray tube. The exterior diagram can be found in Figure 3.
Figure 3: EG-60 Thin Beryllium End-window X-ray Tube
Imported 0.6μm Ultra-thin Polyester Window from Moxtek, USA.
For the measurement of light elements such as Na and Mg, the detector window is crucial; it must be sufficiently thin and robust. This instrument uses the 0.6μm thick ProLINE series 20 window from Moxtek Company, USA. It consists of an ultra-thin polymer layer with a charge dissipation layer coated with 200 Å of aluminum, attached to a sturdy hexagonal metal support frame, thereby achieving high transmission for low-energy X-rays. Analysis down to B(Kα) is possible. Figure 4 shows the exterior diagram, and Figure 5 illustrates the relationship between energy and transmission rate.
Figure 4: Moxtek's Ultra-thin Polyester Window
Figure 5. ProLINE Series Energy and Transmittance
Temperature Control Accuracy of the Constant Temperature Chamber is Less Than 0.1°C
A wavelength dispersive analyzer is an exquisite instrument, particularly the crystal that has extremely high mechanical dimensional requirements. Even slight dimensional changes due to temperature fluctuations can cause variations in intensity. Therefore, the spectrometer chamber must be kept at a constant temperature. The temperature control accuracy of the constant temperature chamber of this instrument is less than 0.1°C. Moreover, apart from the spectrometer chamber, other components such as the detection section and its electronic circuits are also within the constant temperature chamber, thereby isolating the instrument from external temperature influences.
X-ray fluorescence spectrometer WDXRF Multi-element Analysis Spectrometer Wavelength dispersive X-ray fluorescence Analyzer
High-Precision Gas Flow Density Stabilization Device with Pressure Stability Less Than 3Pa
The detector used in this instrument is a gas-flow proportional counter developed and manufactured by our company. The density of the gas flowing through it must remain constant to ensure the stability of the detector. The gas flow system of this instrument employs a high-precision gas flow density stabilization device, with pressure stability less than 3Pa.
Sample Self-Rotation Device to Eliminate Measurement Errors Caused by Sample Inhomogeneity
If a sample is prepared by the powder pressing method, such as one containing SiO2, due to its high hardness, the ground particles may vary in size, leading to an uneven surface of the sample disc. Therefore, this instrument is designed with a sample self-rotation device to minimize measurement errors caused by sample inhomogeneity.
X-ray fluorescence spectrometer WDXRF Multi-element Analysis Spectrometer Wavelength dispersive X-ray fluorescence Analyzer
Calibration
The X-ray fluorescence (XRF) analysis method is a reference method, and calibration is essential to obtain quantitative results. XRF spectrometers achieve quantitative analysis by comparing the spectral intensities of known standards with those of unknown samples. The concentration calculation formula for a particular element (i.e., the calibration curve) is:
In the equation, IC = f(I_0)IC=f(I0), where I_0I0 is the initial intensity and ICIC is the processed intensity. D, E, and F are coefficients determined by calibration. The calibration method is as follows: Measure the intensity of each element in a series of calibration standard samples or certified reference materials using the spectrometer, and use regression analysis, such as the least squares method, to determine the coefficients of equation (1).
Calibrate the spectrometer using 11 national cement raw material standard samples with known concentrations, and the obtained data is presented in Table 1.
Table 1. Calibration Results Data for Cement Raw Material Standard Samples
| Component |
Coefficient D |
Coefficient E |
Coefficient F |
Correlation Coefficient γ |
| Na2O |
Na2O |
Na2O |
Na2O |
Na2O |
| -0.1281 |
-0.1281 |
-0.1281 |
-0.1281 |
-0.1281 |
| 6.7578×10-6 |
6.7578×10-6 |
6.7578×10-6 |
6.7578×10-6 |
6.7578×10-6 |
| 0 |
0 |
0 |
0 |
0 |
| 0.8296 |
0.8296 |
0.8296 |
0.8296 |
0.8296 |
| MgO |
MgO |
MgO |
MgO |
MgO |
| -0.2292 |
-0.2292 |
-0.2292 |
-0.2292 |
-0.2292 |
| 6.0429×10-5 |
6.0429×10-5 |
6.0429×10-5 |
6.0429×10-5 |
6.0429×10-5 |
These calibration curves have correlation coefficients γ that are mostly greater than 0.99, indicating that the GA-D800 multi-element analyzer (dispersive) has an extremely low linear error.
Repeatability
For the same cement raw material sample, 11 measurements were conducted, and the reproducibility data for each element are presented in Table 2.
Table 2. Analysis of Reproducibility Measurement Data for Raw Material Standard Samples (%)
| XS1 standard sample |
Na2O |
MgO |
Al2O3 |
SiO2 |
SO3 |
K2O |
CaO |
Fe2O3 |
| Standard Value |
0.09 |
2.59 |
4.27 |
14.43 |
0.24 |
0.30 |
39.84 |
1.96 |
| Average Value |
0.07 |
2.51 |
4.31 |
14.34 |
0.26 |
0.29 |
39.95 |
1.95 |
| Maximum Value |
0.07 |
2.54 |
4.36 |
14.39 |
0.27 |
0.29 |
39.98 |
1.96 |
| Minimum Value |
0.07 |
2.50 |
4.29 |
14.29 |
0.26 |
0.29 |
39.92 |
1.94 |
| Range |
0 |
0.04 |
0.07 |
0.1 |
0.01 |
0 |
0.06 |
0.02 |
| Standard Deviation of Indications |
0.001 |
0.01 |
0.02 |
0.02 |
0.002 |
0.0014 |
0.02 |
0.005 |
| 3x Standard Deviation of Indications |
0.003 |
0.03 |
0.06 |
0.06 |
0.006 |
0.0042 |
0.06 |
0.015 |
| Repeatability Limit of GB/T 176 |
0.05 |
0.15 |
0.20 |
0.20 |
0.15 |
0.10 |
0.25 |
0.15 |
| Conformance of DM8000 to National Standard |
Far Superior |
Far Superior |
Superior |
Superior |
Far Superior |
Far Superior |
Superior |
Far Superior |
The repeatability requirements of GB/T 176-2017 "Methods of Chemical Analysis of Cement" dictate that the repeatability of a spectrometer must be such that three times its standard deviation of indications does not exceed the repeatability limit specified by GB/T 176. From Table 2, it can be seen that the GA-D800 multi-element analyzer (dispersive) can achieve excellent repeatability.
X-ray fluorescence spectrometer WDXRF Multi-element Analysis Spectrometer Wavelength dispersive X-ray fluorescence Analyzer
Product Parameters
Main technical index
| X-ray tube |
Voltage: ≤50keV
Current: ≤8.0mA
Power ≤400W |
| Detector |
Ultra-thin window flow-through proportional counter. |
| Measurable elements or their oxides. |
Any ten elements or their oxides from Na to U, taking cement as an example (the same below):
Na2O,MgO,Al2O3,SiO2,SO3,TiO2,K2O,CaO,Fe2O3 and so on. |
| Measuring range |
The analysis range for elements or their oxides such as Na2O, MgO, Al2O3, SiO2, SO3, TiO2, K2O, CaO, Fe2O3, etc., can be adjusted,
Calibrated as needed. |
| Measurement range width |
Na2O max-Na2O min≤5%,MgO max-MgO min≤5%
Al2O3max-Al2O3min≤5%,
SiO2 max-SiO2 min7≤%,SO3 max-SO3 min≤5%,TiO2 max-TiO2 min≤5%,
K2O max-K2O min≤5%,CaOmax-CaOmin≤7%,Fe2O3 max-Fe2O3 min ≤5%. |
| Measurement accuracy |
SNa2O≤0.01%,SMgO≤0.03%,SAl2O3≤0.04%,SSiO2≤0.04%,SSO3≤0.01%,
STiO2≤0.01%,SK2O≤0.01%,SCaO≤0.03%,SFe2O3≤0.02%. |
| Compliant with standards |
GB/T 176-2017,JC/T1085-2008,JB/T11145-2011 |
| System measurement time |
1 to 999 s, recommended value: 180 ss. |
| Constant temperature chamber temperature |
36ºC±0.1ºC |
| Operating conditions |
Ambient temperature: 15-28°C, Relative humidity: ≤75% (at 25°C), Power supply: 220V±20V, 50Hz, ≤1.0kW. |
| Dimensions and Weight |
790mm(W)× 760mm(D)× 1200mm(H),195kg |
X-ray fluorescence spectrometer WDXRF Multi-element Analysis Spectrometer Wavelength dispersive X-ray fluorescence Analyzer
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