| Customization: | Available |
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| After-sales Service: | online |
| Warranty: | 1 year |
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High Temperature Four-Probe Resistivity Tester PC Software System Semiconductor conductivity meter
1. overview
1. Four-probe dual-electric combined measurement method to test square resistance and resistivity system combined with high temperature box
2. Configure high-temperature four-probe test probe fixture
3. PC software for data processing and measurement control.
4. Range test range
High Temperature Four-Probe Resistivity Tester PC Software System Semiconductor conductivity meter
2. Application description
The conductivity of semiconductor materials is measured for temperature changes. The measurement and control software draws the temperature and resistance, resistivity, conductivity data change curves in real time, and reports and analyzes the process data values.
High Temperature Four-Probe Resistivity Tester PC Software System Semiconductor conductivity meter
3. Applicable industry
Used in: enterprises, colleges and universities, scientific research departments to measure the resistivity of conductive ceramics, silicon, germanium single crystals (rods, wafers), the square resistance of silicon epitaxial layer, diffusion layer and ion implantation layer, and the square resistance, resistivity and conductivity data of new materials such as conductive glass (ITO) and other conductive films.
The dual-electric measurement four-probe instrument uses a linear four-probe dual-position measurement. The design complies with the single crystal silicon physical test method
standard and refers to the American A.S.T.M standard.
| Models | FT-351A | FT-351B | FT-351C |
| sheet resistance | 10-5~2×105Ω/ | 10-6~2×105Ω/ | 10-4~1×107Ω/ |
| resistivity range | 10-6~2×106Ω-cm | 10-7~2×106Ω-cm | 10-5~2×108Ω-cm |
| test current range | 0.1μA.μA.0μA,100µA,1mA,10mA,100 mA | 1A,100mA,10mA,1mA,100uA,10uA,1uA,0.1uA | 10mA ---200pA |
| current accuracy | ±0.1% | ±0.1 | ±2% |
| resistance accuracy | ≤0.3% | ≤0.3% | ≤10% |
| PC software interface | LCD: resistance.resistivity. sheet resistance. temperature.unit conversion. temperature coefficient. current. voltage. probe shape. probe spacing. thickness | ||
| test mode | Double electrical measurement | ||
| working power | AC 220V±10%.50Hz <30W |
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| errors | ≤3%standard samples) | ≤15% | |
| Highest temperature (choose and buy) |
Normal temperature -400ºC;600ºC;800ºC;1000ºC;1200ºC;1400ºC;1600ºC | ||
| Atmosphere protection(Gas was provided by customers themselves) | The usual gases are: helium (He). neon (Ne). argon (Ar). krypton (Kr). xenon (Xe). and radon (Rn). all in colorless. odorless. gaseous monatomic molecules. | ||
| Temperature precision | Blunt temperature values:≤1-3ºC; control precision:±1°C | ||
| rate of temperature increase | About 15 minutes at room temperature to 400 ºC. 800 ºC;800 ºC to 1200 ºC need 30 minutes;1400 ºC to 1600 ºC to 250 minutes. 300 minutes | ||
| High temperature material | Adopt composite ceramic fiber material. have vacuum forming. high temperature not drop powder | ||
| PC software | One set Special test PC software. USB communication interface. software interface synchronization display. analysis. save and print data! | ||
| Electrode materials | Tungsten electrode or molybdenum electrode | ||
| The probe spacing | Linear probe. probe center spacing: 4mm;Samplerequirements are greater than 13mm diameter | ||
| Except standard configuration (optional) | One set computer and printer 2.Standard resistance 1 to 5pcs | ||
| High temperature power | :400-1200ºC 220V,4KW;380V;1400ºC-1600ºC380V;9KW: Power supply: 400-1200 ºC power 220 v. 4 kw power;380 v;1400 ºC to 1600 ºC power supply380V ; power 9KW |
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