Product Description
ASTM D7220 Multi-monochromatic Excitation Energy Dispersive X-ray Fluorescence Spectrometer for Cement Test MMEDXRF Light and Medium Element Spectrometer tester
Multi-monochromatic excitation achieves high peak-to-background ratio, enabling the measurement of elements from Boron to zinc.
Its accuracy is comparable to that of large-scale wavelength dispersive spectrometers.
The universal type meets the measurement requirements for the elemental concentration of any type of material in various industries.
Technology
Utilizing multi-monochromatic excitation energy dispersive X-ray fluorescence (MMEDXRF) analysis technology.
Logarithmic spiral hyperbolic double-curve bent crystal (LSDCC) for diffraction and serving as a secondary target.
High count rate, high resolution, high transmission (AP3.3 window) SDD detector.
Micro-focus thin beryllium window X-ray tube source with a perfect combination of voltage, current, and target material.
Complies with standards
GB/T3286.11
GB/T4333.5
YS/T63.16
GB/T24198
GB/T24231
GB/T34534
GB/T176
JB/T11145
JC/T1085
ASTM D7220
ASTM D7220 Multi-monochromatic Excitation Energy Dispersive X-ray Fluorescence Spectrometer for Cement Test MMEDXRF Light and Medium Element Spectrometer tester
Overview
The GA-D250 MMEDXRF Light and Medium Element Spectrometer, fully named GA-D250 Multi-Monochromatic Excitation Energy Dispersive X-ray Fluorescence Light and Medium Element (B-Zn) Spectrometer, is an innovative XRF spectrometer developed by our company, drawing on decades of research experience in X-ray fluorescence spectrometers. It builds upon our existing DM series X-ray fluorescence sulfur, calcium, and iron analyzers, multi-element analyzers, and X-ray spectrometers. The GA-D250 utilizes the Multi-Monochromatic Excitation Energy Dispersive X-Ray Fluorescence (MMEDXRF) analysis technology. Key components include a patented logarithmic spiral rotation point-to-point focusing germanium monochromator developed by our company, a 50W micro-focus large radiation angle thin beryllium window X-ray tube produced by KeyWay, and a high-count-rate, high-energy-resolution, high-transmission SDD semiconductor X-ray detector from Ketek in Germany. The spectrometer also features an optical system for light elements with proprietary technology and a combination of multiple monochromatic excitation systems, significantly enhancing the instrument's sensitivity and peak-to-background ratio. It includes an X-ray downward irradiation system, a sample self-rotation device, and options for vacuum or self-inflating systems, depending on the application. These features place the spectrometer at the forefront of international standards, with performance metrics comparable or superior to large wavelength dispersive spectrometers, and a price that is only half that of imported equivalents, offering an unbeatable price-to-performance ratio. Additionally, the convenience of domestic after-sales service is unmatched by foreign companies. The spectrometer's excellent shielding design ensures no radiation leakage, meeting radiation exemption requirements.
ASTM D7220 Multi-monochromatic Excitation Energy Dispersive X-ray Fluorescence Spectrometer for Cement Test MMEDXRF Light and Medium Element Spectrometer tester
Applicability
The GA-D250 MEDXRF Light and Medium Element Spectrometer can measure the content of all materials in various industries. Whether it's environmental protection, metallurgy, chemical industry, geology, mining, electronics, electrical, food, or other industries, and regardless of the type of sample such as pressed powder, fused beads, or liquids, as long as the elements to be measured are within the range of B(5) to Zn(30), the DM2500 can provide accurate measurements. It complies with almost all XRF spectrometry standards for elemental determination, such as national or industry standards GB/T 176-2017 "Methods for Chemical Analysis of Cement," GB/T3286.11-2022 "Chemical Analysis Methods for Limestone and Dolomite-Part 11: Determination of Calcium Oxide, Magnesium Oxide, Silicon Dioxide, Aluminum Oxide, and Iron Oxide Content by Wavelength Dispersive X-ray Fluorescence Spectrometry (Fused Glass Disc Method)," GB/T4333.5-2016 "Determination of Silicon, Manganese, Aluminum, Calcium, Chromium, and Iron in Silicon Iron by Wavelength Dispersive X-ray Fluorescence Spectrometry (Fused Glass Disc Method)," YS/T63.16-2019 "Test Methods for Carbonaceous Materials for Aluminum-Part 16: Determination of Element Content by Wavelength Dispersive X-ray Fluorescence Spectrometry," GB/T24198-2009 "Nickel Iron-Determination of Nickel, Silicon, Phosphorus, Manganese, Cobalt, Chromium, and Copper Content by Wavelength Dispersive X-ray Fluorescence Spectrometry (Routine Method)," and also complies with industry standards JC/T1085-2008 "X-ray Fluorescence Analyzer for Cement" and JB/T11145-2011 "X-ray Fluorescence Spectrometer."
If you have special requirements for the measurement of certain elements, our company can modify the monochromatic excitation system and/or software system according to your requirements to meet the measurement element requirements.
ASTM D7220 Multi-monochromatic Excitation Energy Dispersive X-ray Fluorescence Spectrometer for Cement Test MMEDXRF Light and Medium Element Spectrometer tester
Features
Fast Simultaneous Analysis: Rapid simultaneous analysis of required elements, typically providing content results within dozens of seconds.
High Accuracy: Utilizing advanced MMEDXRF technology and LSDCC core technology, the energy of monochromatic light and the method of generating monochromatic light are selected according to the elements to be measured, greatly improving the instrument's sensitivity and peak-to-background ratio, with excellent repeatability and reproducibility, and extremely high accuracy.
Downward Irradiation: The X-ray downward irradiation system eliminates the possibility of sample powder contamination damaging the detection system, making it particularly suitable for powder pressed samples.
Sample Self-Rotation: Equipped with a sample self-rotation device to eliminate sample heterogeneity caused by the presence of particularly hard substances that are difficult to crush in pressed samples.
Long-Term Stability: Features variable gain digital multi-channel technology with automatic PHA adjustment, drift correction, and deviation correction functions, ensuring excellent long-term stability.
Eco-Friendly and Energy-Saving: Radiation protection meets exemption requirements. The analysis does not contact or destroy samples, is pollution-free, does not require chemical reagents, nor does it require combustion.
Easy to Use: Touchscreen operation. After crushing and pressing the sample and placing it into the instrument, simply press the [Start] button to achieve one-click operation.
High Reliability: Integrated design with high integration, strong environmental adaptability, strong anti-interference capability, and high reliability.
High Cost Performance: No need for steel cylinder gas, extremely low operating and maintenance costs. The price is half that of similar foreign products. It is a truly high cost-performance product.
Calibration
X-ray fluorescence analysis is a reference method, and calibration is necessary to obtain quantitative results. XRF spectrometers determine the quantitative analysis results by comparing the spectral intensity of known standard samples with unknown samples. The calculation formula for the content of an element (i.e., the calibration curve) is:
In the formula,IC =f(I0),I0, where I0I0 is the original intensity (i.e., the original channel count rate), IC is the processed intensity (or corrected intensity), and D, E, F are coefficients determined by calibration. The calibration method is to measure the intensity of each element in a series of calibration standard samples or certified reference materials with the spectrometer, and use regression analysis, such as the least squares method, to determine the coefficients of (1).
Calibrate the spectrometer with a known aluminum carbon standard sample to obtain the data as shown in Table 1.
Table 1. Calibration Results Data for Aluminum Carbon Calibration Samples (ppm)
| element |
Na |
Si |
S(%) |
Ca |
V |
Fe |
Ni |
| Coefficient D |
-489.8 |
-66.93 |
-0.34 |
-276.9 |
-372.7 |
-158.1 |
-140.2 |
| Coefficient E |
0.9447 |
6.458 |
1.58 |
1.074 |
1.251 |
0.2932 |
0.854 |
| Coefficient F |
0 |
0 |
0 |
0 |
0 |
0 |
0 |
| Correlation Coefficient γ |
0.9612 |
0.9971 |
0.9956 |
0.9833 |
0.9977 |
0.9561 |
0.9742 |
ASTM D7220 Multi-monochromatic Excitation Energy Dispersive X-ray Fluorescence Spectrometer for Cement Test MMEDXRF Light and Medium Element Spectrometer tester
Repeatability
A specific sample from the aluminum carbon materials was measured 11 times to obtain the reproducibility data for each element as shown in Table 2.
Table 2. Reproducibility Analysis of Aluminum Carbon Sample Measurements (ppm)
| Element |
Na |
Si |
S(%) |
Ca |
V |
Fe |
Ni |
| Theoretical Value |
111.5 |
223 |
1.56 |
311.8 |
410 |
242 |
242 |
| Average Reading |
105.80 |
225.36 |
1.55 |
312.52 |
412.91 |
232.61 |
235.02 |
| Maximum Reading |
108.09 |
228.23 |
1.56 |
315.88 |
418.04 |
234.13 |
237.35 |
| Minimum Reading |
102.4 |
223.19 |
1.54 |
310.3 |
410.69 |
231.48 |
233.87 |
| Range |
5.69 |
5.04 |
0.02 |
5.58 |
7.35 |
2.65 |
3.48 |
| Reading Standard Deviation |
2.11 |
2.13 |
0.0071 |
2.21 |
3.01 |
0.96 |
1.41 |
| 3x Reading Standard Deviation (Instrument Repeatability Limit) |
6.33 |
6.39 |
0.021 |
6.63 |
9.03 |
2.88 |
4.23 |
| Repeatability Limit of GB/T176 |
15 |
23 |
0.033 |
15 |
15 |
9 |
8 |
| Allowable Difference of YS/T63.16 |
35 |
45 |
0.10 |
30 |
25 |
25 |
20 |
| Conformance of GA-D2500 to YS/T63.16 |
Far Superior |
Far Superior |
Superior |
Far Superior |
Superior |
Far Superior |
Superior |
Note: Powder pressed pellet samples. The results were obtained under the conditions of the X-ray source at half power (25W) and a measurement time of 300 seconds, with 11 consecutive measurements.
From the above table, it can be seen that the repeatability limits of the spectrometer are all less than the repeatability limits required by the industry standard YS/T63.16-2019 "Test Methods for Carbonaceous Materials for Aluminum-Part 16: Determination of Element Content by Wavelength Dispersive X-ray Fluorescence Spectrometry." Therefore, the GA-D250 spectrometer can achieve excellent repeatability and fully meets the repeatability requirements of YS/T63.16-2019.
ASTM D7220 Multi-monochromatic Excitation Energy Dispersive X-ray Fluorescence Spectrometer for Cement Test MMEDXRF Light and Medium Element Spectrometer tester
Product Parameters
Main technical index
| Measurement element |
Any element from B(5) to Zn(30) can be selected |
| X-ray tube |
voltage:≤50keV,Current:≤2mA,power≤50W,target materials:Ag(Mo,Rh,Pd,Cr) |
| Detector |
Ultra-thin beryllium window proportional counter |
| Detection Limits(300s) |
C:2.0%,N:1.0%,O:0.5%,F:0.15%,Na:30ppm
Mg:20ppm, Al:10ppm, Si/P/S/Cl:2.0ppm, K-Zn:3.0ppm |
| measuring range |
3 times the detection limit to 9.99% |
| Repeatability Limit |
Meets the requirements of nearly all elemental determination X-ray Fluorescence (XRF) spectrometry standards, such as: GB/T 176-2017, GB/T3286.11-2022, GB/T4333.5-2016, YS/T63.16-2019, GB/T24198-2009, etc. |
| System analysis time |
1~999s,Recommended value: 300s |
| Service Conditions |
Ambient Temperature: 5-40°C
Relative Humidity: ≤85% (at 30°C)
Power Supply: 220V±20V, 50Hz, ≤200W |
| Measuring atmosphere |
Self-charging system or helium |
| Size and weight |
540mm×500mm×450mm,35kg |
Note: The detection limit is related to the sample matrix.
ASTM D7220 Multi-monochromatic Excitation Energy Dispersive X-ray Fluorescence Spectrometer for Cement Test MMEDXRF Light and Medium Element Spectrometer tester
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In the formula,IC =f(I0),I0, where I0I0 is the original intensity (i.e., the original channel count rate), IC is the processed intensity (or corrected intensity), and D, E, F are coefficients determined by calibration. The calibration method is to measure the intensity of each element in a series of calibration standard samples or certified reference materials with the spectrometer, and use regression analysis, such as the least squares method, to determine the coefficients of (1).
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