| Customization: | Available |
|---|---|
| After-sales Service: | online |
| Warranty: | 1 year |
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ASTM F84 Double electric four-probe resistance ratio tester Square resistance resistivity tester
1. Widely used
1. Covering film; conductive polymer film, high and low temperature electric heating film; heat insulation, conductive window film conductive (shielding) cloth, decorative film, decorative paper; metallized label, alloy foil film; melting, sintering, sputtering, coating, coating layer, resistive, capacitive touch screen film; electrode coating, other semiconductor materials, thin film material square resistance test
2. Silicon crystal block, wafer resistivity and diffusion layer, epitaxial layer, ITO conductive foil film, conductive rubber and other materials square resistance Semiconductor materials/wafers, solar cells, electronic components, conductive films (ITO conductive film glass, etc.), metal films, conductive paint films, evaporated aluminum films, PCB copper foil films,
3. Sheet resistance and resistivity of EMI coatings and other materials Conductive paint, conductive paste, conductive plastic, conductive rubber, conductive film, metal film,
4. Antistatic materials, EMI protective materials, conductive fibers, conductive ceramics, etc.,
ASTM F84 Double electric four-probe resistance ratio tester Square resistance resistivity tester
2. Description
1. Four-probe combination dual-electric measurement method
2. LCD display, automatic measurement, automatic range, automatic coefficient compensation.
3. Integrated circuit system, constant current output.
4. Optional: PC software for data management and processing.
5. Provide Chinese or English language operation interface selection
ASTM F84 Double electric four-probe resistance ratio tester Square resistance resistivity tester
3. Reference standards
1. Standard for silicon wafer resistivity measurement (ASTM F84).
2. GB/T 1551-2009 "Method for determination of resistivity of silicon single crystal".
3. GB/T 1551-1995 "Determination of resistivity of silicon and germanium single crystal by DC two-probe method".
4. GB/T 1552-1995 "Determination of resistivity of silicon and germanium single crystal by DC four-probe method"
| model | FT-341 | FT-342 | FT-343 | FT-345 | FT-346 | FT-347 |
| sheet resistance |
10-5~2×105Ω/ | 10-4~2×105Ω/ | 10-3~2×105Ω/ | 10-3~2×104Ω / | 10-2~2×105Ω/ | 10-2~2×104Ω/ |
| Resistivity | 10-6~2×106Ω-cm | 10-5~2×106Ω-cm | 10-4~2×106Ω-cm | 10-4~2×105Ω-cm | 10-3~2×106Ω-cm | 10-3~2×106Ω-cm |
| Test current | 0.1μA.μA.0μA,100µA,1mA,10mA,100mA | 1μA,10μA,100µA,1mA,10mA,100mA | 0.1μA.μA,10μA,100µA,1mA,10mA,100 mA | 1μA,10μA,100µA,1mA,10mA,100mA | 0.1μA,1μA,10μA,100µA,1mA,10mA,100mA | 1μA,10μA,100µA,1mA,10mA,100mA |
| Current | ±0.1% accuracy | ±0.2% accuracy | ±0.2% accuracy | ±0.3% accuracy | ±0.3% accuracy | ±0.3% accuracy |
| Resistance | ≤0.3% accuracy | ≤0.3% accuracy | ≤0.3% accuracy | ≤0.5% accuracy | ≤0.5% accuracy | ≤0.5% accuracy |
| display | Large screen LCD: Resistance. resistivity. sheet resistance. temperature. unit conversion.temperature coefficient. current. voltage. probe shape. probe spacing. thickness. conductivity | |||||
| Test method | Double electrical measurement | |||||
| Power | AC 220V±10%.50Hz | |||||
| errors | ≤3% | |||||
| choose to buy |
1.pc software; 2. square probe; 3. linear probe; 4. test platform | |||||
| test probe | Optional probe spacing: 1mm;2mm;3mm in three sizes.Select probe material: tungsten carbide needle. white steel needle. gilded copper hemispherical needles. | |||||
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