| Customization: | Available |
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| After-sales Service: | Online |
| Warranty: | 1 Year |
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Professional performance film thickness meter thickness gauge for metal film X-RAY flourescence spectrometer
1. Product Introduction
The T450 series of professional performance film thickness gauges are crafted with exquisite quality by Jiapu Instruments. They adopt micro-focus enhanced ray tube and digital multi-channel pulse signal processing technology. They are also equipped with enhanced FP algorithm software and zoom device. They can detect various large and small planes, It is more accurate, stable and efficient when processing special-shaped parts, multi-layer alloys and electroplating solutions.
Professional performance film thickness meter thickness gauge for metal film X-RAY flourescence spectrometer
2.Technical parameters
| Micron-level movement accuracy | High-precision mobile platform, fast and accurate positioning for multi-point inspection |
| Micro-focused highly integrated vertical optical path switching device | Cutting-edge optical path focusing system design enables efficient, accurate and stable detection of extremely small measurement points |
| Zoom and focus integrated technology | It can perform non-destructive testing on various special-shaped groove parts, and the groove depth range can reach 35mm. |
| Large area si-pin semiconductor detector | The industry has more choices for high-performance and high-resolution detectors, which can greatly improve measurement accuracy and stability. |
| Low cost of use | Low operation and maintenance costs, no wearing and consumables, and relatively low requirements on the use environment |
| Extra long service life | Intelligent high-voltage control combined with a heat dissipation system greatly improves the service life and stability of the instrument. |
| model | T450 | T450S |
| Coating analysis | Li(3)-U(92) | |
| algorithm | Enhanced FP algorithm | |
| Analysis software | Can analyze 15 layers of coatings and 24 elements at the same time | |
| Ray direction | from bottom to top | |
| X-ray generating device | Microfocus enhanced ray tube | |
| receiver | Large area si-pin semiconductor detector | SDD detector |
| multichannel analyzer | DPP digital multi-channel analysis technology | |
| high pressure | 0-50KV intelligent program-controlled high-voltage system | |
| collimator | Standard configuration Ф0.3mm (three choices of Ф0.3mm/Ф0.2mm/Ф0.5mm-) | |
| Sample observation | Industrial CCD HD camera | |
| magnification | Optical magnification 30 times | |
| Spot spread | <10% | |
| zoom device | Standard configuration (can measure concave and convex special-shaped parts) | |
| mobile platform | Standard XY mobile platform | |
| Appearance size | 555*573*573mm | |
| Cavity size | 410*478*245mm | |
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